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511.

In the following circuit, X is given by

[2 marks]
(A) X = AB C + A BC + A B C + ABC
(B) X = A BC + AB C + ABC + A B C
(C) X = AB + BC + AC
(D) X = A B + B C + A C

asked in Electronics and Communication Engineering, 2007

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512.

The circuit diagram of a standard TTL NOT gate is shown in the figure. When V_i= 2.5V, the modes of operation of the transistors will be:

[2 marks]
(A) Q₁ :reverse active; Q₂ :normal active; Q₃ :saturation; Q₄ :cut-off
(B) Q₁ :reverse active; Q₂ :saturation; Q₃ :saturation; Q₄ :cut-off
(C) Q₁ :normal active; Q₂ :cut-off; Q₃ :cut-off; Q₄ : saturation
(D) Q₁ :saturation; Q₂ :saturation; Q₃ :saturation; Q₄ :normal active

asked in Electronics and Communication Engineering, 2007

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513.

The Boolean expression Y = A B C D + A BCD + AB C D + ABC D can be minimized to [2 marks]
(A) Y = A B C D + A BC + AC D
(B) Y = A B C D + BCD + AB C D
(C) Y = A BCD + BCD + AB C D
(D) Y = A BCD + BCD + ABC D

asked in Electronics and Communication Engineering, 2007

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514.

For the Zener diode shown in the figure, the Zener voltage at knee is 7V, the knee current is negligible and the Zener dynamic resistance is 10Ω. If the input voltage (V_i) range is from 10 to 16V, the output voltage (V_o) ranges from

[2 marks]
(A) 7.00 to 7.29 V
(B) 7.14 to 7.29 V
(C) 7.14 to 7.43 V
(D) 7.29 to 7.43 V

asked in Electronics and Communication Engineering, 2007

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515.

In the CMOS inverter circuit shown, if the transconductance parameters of the NMOS and PMOS transistors are
k_n= k_p = µC_ox W_n/L_n = µ_pC_ox W_p/L_p = 40µA/V² and their threshold voltages are V_THn= |V_THp| =1V, the current I is:

[2 marks]
(A) 0 A
(B) 25 µA
(C) 45 µA
(D) 90 µA

asked in Electronics and Communication Engineering, 2007

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516.

In the Op-Amp circuit shown, assume that the diode current follows the equation
I= I_s exp(V/V_T). For V_i =2V, V_o=V_o1, anf for V_i=4V, V_o=V_o2. The relationship between V_o1 and V_o2 is :

[2 marks]
(A) V_o2 = √2 V₀₁
(A) V_o2 = e2 V₀₁
(A) V_o2 = V₀₁ ln2
(A) V_o1 - V_o2 = V_T ln2

asked in Electronics and Communication Engineering, 2007

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